XRD is a method for materials characterization and quality control. The crystalline structure causes a beam of incident X-rays to diffract into many specific directions. Measurement of the intensities and angles of these diffracted beams can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds,.... This Owner has extensive R&D capabilities in the optics engineering world.
- ISO 9001
- More than 50 years of experience in the sector