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Time-of-Flight Secondary Ion Mass Spectrometry

Operator: Always included

Used to analyze secondary ions of the surface.

Description

This technique uses a pulsed ion beam to remove molecules from the outersurface. Particles are then removed from the 'secondary surface' which can be identified by accelerating them into a "flight tube". Their mass can then be determined measuring the time-of-flight. This Owner has extensive R&D capabilities in the optics engineering world.

Quality labels

  • ISO 9001
  • More than 50 years of experience in the sector