High Temperature X-Ray Diffraction Analysis

Description

Used for determining structure by directing a beam of X-rays at the sample which is heated from 25 to 2000 °C and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. This Owner has extensive R&D capabilities in the optics engineering world.

Quality labels

• ISO 9001
• More than 50 years of experience in the sector