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High Temperature X-Ray Diffraction Analysis

Operator: Default included

To analyze all kinds of matter, ranging from fluids, to powders and crystals.

Description

Used for determining structure by directing a beam of X-rays at the sample which is heated from 25 to 2000 °C and detecting the positions and intensities of the diffracted X-rays as a pattern of spots on a photographic plate. This Owner has extensive R&D capabilities in the optics engineering world.

Quality labels

  • ISO 9001
  • More than 50 years of experience in the sector